eprintid: 63918
rev_number: 7
eprint_status: archive
userid: 1315
dir: disk0/00/06/39/18
datestamp: 2019-05-23 04:36:28
lastmod: 2019-05-23 04:36:28
status_changed: 2019-05-23 04:36:28
type: article
metadata_visibility: show
contact_email: ariswan@uny.ac.id
creators_name: Ariswan, Ariswan
creators_id: ariswan@uny.ac.id
title: Structural, Chemical Composition and Optical Properties of CdTe Fabricated by Vacuum Evaporation Technique
ispublished: pub
subjects: F2
divisions: fmipa_jurdik_fisika_fisika
full_text_status: public
keywords: Vacuum evaporation, polycrystalline, cadmium telluride, thin films
abstract: CdTe polycrystalline thin films had been fabricated using vacuum evaporation technique. Their properties had been investigated using X-ray diffraction, energy dispersive spectroscopy (EDS), scanning electron microscope (SEM) and uv-vis spectroscopy. The results showed that the CdTe thin films crystalized at hexagonal structure with lattice parameters a = 6.45 Å and c =7.66 Å. The EDS results showed that the chemical composition was non stoichiometry, slightly rich of Tellerium with Cd/Te of 0.9. It had a uniform shape with color homogenity and an optical band gap at room temperature about 1.47eV.
date: 2014-02-19
date_type: published
publication: Advanced Materials Research
volume: 896
publisher: Trans Tech Publications
pagerange: 497-501
id_number: 10.4028/www.scientific.net/AMR.1101.134
refereed: TRUE
issn: 1662-8985
official_url: https://www.scientific.net/AMR.896.497
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citation:   Ariswan, Ariswan  (2014) Structural, Chemical Composition and Optical Properties of CdTe Fabricated by Vacuum Evaporation Technique.  Advanced Materials Research, 896.  pp. 497-501.  ISSN 1662-8985     
document_url: http://eprints.uny.ac.id/63918/1/Artikel%202_1.pdf