TY  - JOUR
KW  - Vacuum evaporation
KW  -  polycrystalline
KW  -  cadmium telluride
KW  -  thin films
ID  - UNY63918
SN  - 1662-8985
VL  - 896
N2  - CdTe polycrystalline thin films had been fabricated using vacuum evaporation technique. Their properties had been investigated using X-ray diffraction, energy dispersive spectroscopy (EDS), scanning electron microscope (SEM) and uv-vis spectroscopy. The results showed that the CdTe thin films crystalized at hexagonal structure with lattice parameters a = 6.45 Å and c =7.66 Å. The EDS results showed that the chemical composition was non stoichiometry, slightly rich of Tellerium with Cd/Te of 0.9. It had a uniform shape with color homogenity and an optical band gap at room temperature about 1.47eV.
Y1  - 2014/02/19/
EP  - 501
A1  - Ariswan, Ariswan
PB  - Trans Tech Publications
SP  - 497
TI  - Structural, Chemical Composition and Optical Properties of CdTe Fabricated by Vacuum Evaporation Technique
AV  - public
UR  - https://www.scientific.net/AMR.896.497
JF  - Advanced Materials Research
ER  -