%L UNY11534
%K Bridgman technique, lead , selenium and Tellurium
%X This study aimed to determine the effect of atomic fraction x of tellurium (Te) on the lattice parameters
and the crystal structure of the Pb (Se, Te) compound prepared using Bridgman technique. Further
characterization of the materials used X-Ray Difraction to determine the lattice parameters and the crystal
structure. The chemical composition was determined using Energy Dispersive Spectroscopy (EDS), and
the surface morfology shown by Scanning Electron Microscope (SEM). The results showed that all
compounds crystallized in a cubic crystal structure and the lattice parameters of the crystal were a
function of the fraction x of Tellurium atoms. EDS results showed that all samples were non
stoichiometric but approached ideal composition. All compounds had identical surface because it had a
cubic structure with homogeneous materials.
%A Ariswan Ariswan
%A Darmawan Denny
%I Yogyakarta State University
%D 2014
%J Proceeding of International Conference On Research, Implementation And Education Of Mathematics And Sciences 2014
%T THE EFFECT OF TELLURIUM ATOMIC FRACTION ON THE CRYSTAL
STRUCTURE AND CHEMICAL COMPOSITION OF Pb (Se1-x, Tex)
SEMICONDUCTOR MATERIALS PREPARED USING BRIDGMAN
TECHNIQUE